This sourcebook is intended as an X-ray data reference for scientists and
engineers working in the field of energy or wave-length dispersive X-ray
spectrometry and related fields of basic and applied research, technology,
or process and quality controlling. In a concise and informative manner, the
most important data connected with the emission of characteristic X-ray lines
are tabulated for all elements up to Z = 100 (fermium). This includes X-ray
energies, emission rates and widths as well as level characteristics such as
binding energies, fluorescence yields, level widths and absorption edges.
The tabulated data are characterized and, in most cases, evaluated.
Furthermore, all important processes and phenomena connected with the
production, emission and detection of characteristic X-rays are discussed.
This reference book adresses all researchers and practitioners working with
X-ray radiation and fills a gap in the available literature.
Table Of Contents:
Part I Atomic Structure,X-ray Physics and Radiation Detection
Part II X-Ray Reference Data
* ISBN: 3540286187
* ISBN-13: 9783540286189
* Format: Hardcover, 967pp
* Publisher: Springer-Verlag New York, LLC
* Pub. Date: October 2006