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Handbook of Microscopy for Nanotechnology~tqw~ darksiderg

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Handbook of Microscopy for Nanotechnology
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Type.................: Ebook
Part Size............: 18,518,871 bytes




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Posted by............: ~tqw~

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Release Notes
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Nanostructured materials take on an enormously rich variety of properties and
promise exciting new advances in micromechanical, electronic, and magnetic
devices as well as in molecular fabrications. The
structure-composition-processing-property relationships for these sub 100
nm-sized materials can only be understood by employing an array of modern
microscopy and microanalysis tools. This complete reference provides a thorough
treatment of these techniques and their applications in this fast-growing field.

Table Of Contents

Preface xv
List of Contributors xvii
Part I. OPTICAL MICROSCOPY, SCANNING PROBE MICROSCOPY, ION MICROSCOPY, AND
NANOFABRICATION 1
1. Confocal Scanning Optical Microscopy and Nanotechnology 3
2. Scanning Near Field Optical Microscopy in Nanosciences 25
3. Scanning Tunneling Microscopy 55
4. Visualization of Nanostructures with Atomic Force Microscopy 113
5. Scanning Probe Microscopy for Nanoscale Manipulation and Patterning 157
6. Scanning Thermal and Thermoelectric Microscopy 183
7. Imaging Secondary Ion Mass Spectrometry 207
8. Atom Probe Tomography 227
9. Focused Ion Beam Systems—A Multifunctional Tool for Nanotechnology 247
10. Electron Beam Lithography 287
Part II. ELECTRON MICROSCOPY 323
11. High Resolution Scanning Electron Microscopy 325
12. High-Spatial Resolution Quantitative Electron Beam Microanalysis for
Nanoscale Materials 361
13. Characterization of Nano-Crystalline Materials using Electron Backscatter
Diffraction in the Scanning Electron Microscope 401
14. High-Resolution Transmission Electron Microscopy 427
15. Scanning Transmission Electron Microscopy 455
16. In-Situ Electron Microscopy for Nanomeasurements 493
17. Environmental Transmission Electron Microscopy in Nanotechnology 531
18. Electron Nanocrystallography 567
19. Tomography using Transmission Electron Microscope 601
20. Off-Axis Electron Holography 629
21. Sub-nm Spatially Resolved EELS (Electron Energy-Loss Spectroscopy):
Methods, Theory and Applications 653
22. Imaging Magnetic Structures using Transmission Electron Microscopy Methods
683
Index 717

Product Details

* ISBN: 1402080034
* ISBN-13: 9781402080036
* Format: Hardcover, 731pp
* Publisher: Springer-Verlag New York, LLC
* Pub. Date: March 2005

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