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Name:Atomic Force MicroscopyScanning Tunneling Microscopy 3~tqw~ darksiderg

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Atomic Force Microscopy/Scanning Tunneling Microscopy 3
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General Information
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Type.................: Ebook
Part Size............: 4,884,605 bytes




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Posted by............: ~tqw~

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Release Notes
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This proceedings is based on the third Atomic Force Microscopy/Scanning
Tunneling Microscopy symposium. The purpose of the meeting was to provide an
interface between scientists, engineers, representatives of industry,
government, and academia, all of whom have a common interest in probe
microscopies. The papers have been written by experts in probe microscopy from
around the world, representing a wide range of disciplines, including physics,
biotechnology, nanotechnology, chemistry, and materials science.

Table of Contents
Preface. Keynote Paper: A Practical Approach to Understanding Surface
Metrologyand Its Applications
C.A. Brown.

Applications of Scanning Probe Microscopy in Materials Science: Examples of
Surface Modification and Quantitative Analysis
P. von Blanckenhagen.

Scanning Probe Microscopy in Biology with Potential Applications in Forensics
J. Vesenka, E. Morales.

Atomic Manipulation of Hydrogen on Hydrogen-Terminated Silicon Surfaces with
Scanning Tunneling Microscope
D.H. Huang, Y. Yamamoto.

Apollo 11 Lunar Samples: An Examination Using Tapping Mode Atomic Force
Microscopy and Other Microscopic Methods
E.C. Hammond, et al.

Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy
W. Scholz, et al.

Imaging of Cell Surface Structure by Scanning Probe Microscopy
V.A. Fedirko, et al.

A Force Limitation for Successful Observation of Atomic Defects: Defect Trapping
of the Atomic Force Microscopy Tip
I.Y. Sokolov, et al.

A New Approach To Examine Interfacial Interaction Potential Between a Thin Solid
Film or a Droplet and a Smooth Substrate
R. Mu, et al.

Nanometer-Scale Patterning of Surfaces Using Self-Assembly Chemistry. 1.
Preliminary Studies of Polyaniline Electrodeposition on Self-Assembled Mixed
Monolayers
W.A. Hayes, C. Shannon.

Local Rate of Electroless Copper Deposition by Scanning Tunneling Microscopy
C.J. Weber, et al.

Atomic Force Microscopy of Olivine
C. Wilson, et al.

The Study of Sublimation Rates and Nucleation and Growth of TNT and PETN on
Silica and Graphite Surfaces by Optical and Atomic Force Microscopy and
Ellipsometry
Y.S. Tung,

Peculiarities of the Scanning Tunneling Microscopy Probe on Porous Gallium
Phosphide
V.M. Ichizli, et al.

Influence of Doping Concentration on The Etching Rate of GaAs Studied by Atomic
Force Microscopy
R.S. Freitas, et al.

Comparative Scanning Tunneling Microscopy Studies of CoFe2O4 Nanoparticles of
Ferrofluids in Acidic Medium
D. Dai, et al.

From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary
Grains
J. Romstedt, et al.

Synthesis of Prebiotic Peptides and Oligonucleotides on Clay Mineral Surfaces: A
Scanning Force Microscopy Study
T.L. Porter, et al.

Surface Structure and Intercalative Polymerization Studies of Smectite Clay Thin
Films
T.L. Porter, et al.

Atomic Force Microscopy –
A New and Complementary Tool in Asphalt Research Compared to Scanning Electron
Microscopy
Loeber, et al.

Index.

Product Details

* ISBN: 0306462974
* ISBN-13: 9780306462979
* Format: Hardcover, 218pp
* Publisher: Springer-Verlag New York, LLC
* Pub. Date: December 1999

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